HYDROGEN-INDUCED MODIFICATION OF THE OPTICAL-PROPERTIES OF THE GAAS(100) SURFACE

被引:21
作者
ESSER, N
SANTOS, PV
KUBALL, M
CARDONA, M
ARENS, M
PAHLKE, D
RICHTER, W
STIETZ, F
SCHAEFER, JA
FIMLAND, BO
机构
[1] TECH UNIV BERLIN,INST FESTKORPERPHYS,D-10623 BERLIN,GERMANY
[2] UNIV KASSEL,FACHBEREICH PHYS,D-34132 KASSEL,GERMANY
[3] TECH UNIV ILMENAU,INST PHYS,D-98693 ILMENAU,GERMANY
[4] NORWEGIAN INST TECHNOL,DEPT PHYS ELECTR,N-7034 TRONDHEIM,NORWAY
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1995年 / 13卷 / 04期
关键词
D O I
10.1116/1.587875
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The influence of hydrogen adsorption on the surface order, dielectric function, and dielectric anisotropy was investigated for the three main reconstructions of the GaAs(100) surface [c(4X4), (2X4), (4X2)] by low-energy electron diffraction, spectroscopic ellipsometry, and reflectance difference spectroscopy. For all reconstructions, low hydrogen exposure removes the surface dimers, whereas surface roughening is observed at high hydrogen exposures. However, detailed differences can be resolved depending on the surface reconstruction. On the As-rich c(4X4) surface, the outermost As-dimers are removed at low H-exposures leaving behind a still As-rich surface of (1X1) symmetry. Thereafter, more As is removed and a new surface anisotropy develops due to the exposed Ga-dimers arranged in a mixture of (1X2) and (root 2X root 2)-reconstructions. For H-adsorption on the (2X4)- and (4X2)-surfaces, in contrast, only the subsequent reduction of the surface reconstruction is observed with increasing exposure, but no structural rearrangement. The removal of the As- [Ga-] dimers modifies the surface symmetry from (2X4) [(4X2)] through (1X4) [(4X1)] to (1X1). Finally, for large exposures, inhomogeneous surface etching by hydrogenation leads to rough, disordered surfaces for all three reconstructions. (C) 1995 American Vacuum Society.
引用
收藏
页码:1666 / 1671
页数:6
相关论文
共 31 条
[1]   INFLUENCE OF HYDROGEN ADSORPTION ON THE OPTICAL-PROPERTIES OF THE GAAS(100)-C(4X4) SURFACE [J].
ARENS, M ;
KUBALL, M ;
ESSER, N ;
RICHTER, W ;
CARDONA, M ;
FIMLAND, BO .
PHYSICAL REVIEW B, 1995, 51 (16) :10923-10928
[3]   APPLICATION OF REFLECTANCE DIFFERENCE SPECTROSCOPY TO MOLECULAR-BEAM EPITAXY GROWTH OF GAAS AND ALAS [J].
ASPNES, DE ;
HARBISON, JP ;
STUDNA, AA ;
FLOREZ, LT .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (03) :1327-1332
[4]  
ASPNES DE, 1985, J VAC SCI TECHNOL B, V3, P1502
[5]  
BACHRACH RZ, 1982, J PHYS C SOLID STATE, V5, P145
[6]   SURFACE RECONSTRUCTIONS OF GAAS(100) OBSERVED BY SCANNING TUNNELING MICROSCOPY [J].
BIEGELSEN, DK ;
BRINGANS, RD ;
NORTHRUP, JE ;
SWARTZ, LE .
PHYSICAL REVIEW B, 1990, 41 (09) :5701-5706
[7]  
CHADI DJ, 1987, J VAC SCI TECHNOL A, V5, P884
[8]   THEORY OF DIELECTRIC-FUNCTION ANISOTROPIES OF (001) GAAS (2X1) SURFACES [J].
CHANG, YC ;
ASPNES, DE .
PHYSICAL REVIEW B, 1990, 41 (17) :12002-12012
[9]   OPTICAL ANISOTROPY SPECTRA OF GAAS(001) SURFACES [J].
CHANG, YC ;
REN, SF ;
ASPNES, DE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (04) :1856-1862
[10]   BONDING DIRECTION AND SURFACE-STRUCTURE ORIENTATION ON GAAS (001) [J].
CHO, AY .
JOURNAL OF APPLIED PHYSICS, 1976, 47 (07) :2841-2843