HIGH-FIELD HOLE INJECTION, CONDUCTION, AND BREAKDOWN IN POLYETHYLENE FILMS FABRICATED BY PLASMA POLYMERIZATION

被引:33
作者
LIU, D
KAO, KC
机构
[1] Materials and Devices Research Laboratory, Department of Electrical and Computer Engineering, University of Manitoba, Winnipeg
关键词
D O I
10.1063/1.348966
中图分类号
O59 [应用物理学];
学科分类号
摘要
The current-voltage (I-V) characteristics of polyethylene films fabricated by plasma polymerization have been measured at very high electric fields using linear ramp voltages. Experimental results show that at average fields higher than 1 MV/cm, electric conduction is mainly due to the Fowler-Nordheim-type tunneling injection of holes from the anode and the high hole mobility. There is no evidence of impact ionization at fields close to the breakdown strength. High-field conduction is filamentary and governed by the trapped hole space charge. Internal discharges such as electrical treeing and breakdown are initiated by thermal instability within high-current density regions of main conduction filaments (or channels), and then followed by the creation of low-density domains to provide large mean free paths for subsequent impact ionization which leads to an indefinite increase in carrier multiplication and final destruction of the material inside the filaments.
引用
收藏
页码:2489 / 2496
页数:8
相关论文
共 44 条