INFLUENCE OF FOIL ROTATION ON DIFFRACTION CONTRAST FROM SMALL SPHERICAL VOIDS IN SILICON

被引：2

作者：

MAGEE, TJ ^{[1
]}

机构：

[1] STANFORD RES INST,MENLO PK,CA 94025

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1974年 / 26卷 / 02期

关键词：

D O I：

10.1002/pssa.2210260204

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：425 / 435

页数：11

共 8 条

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[6] DIFFRACTION CONTRAST FROM SMALL SPHERICAL VOIDS IN SILICON [J].

MAGEE, TJ ;

MORRISS, RH ;

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PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1972, 13 (01) :107-&

[7]

MCINTYRE KG, 1966, J PHYSIQUE, V27, P179

[8] INVESTIGATION OF NEUTRON-IRRADIATION DAMAGE IN SILICON BY TRANSMISSION ELECTRON MICROSCOPY [J].

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