INVESTIGATION OF NEUTRON-IRRADIATION DAMAGE IN SILICON BY TRANSMISSION ELECTRON MICROSCOPY

被引：38

作者：

PANKRATZ, JM

SPRAGUE, JA

RUDEE, ML

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1968年 / 39卷 / 01期

关键词：

D O I：

10.1063/1.1655713

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：101 / &

共 33 条

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