SOFT-X-RAY DAMAGE TO P-TERPHENYL COATINGS FOR DETECTORS

被引：1

作者：

BENITEZ, EL ^{[1
]}

DARK, ML ^{[1
]}

HUSK, DE ^{[1
]}

SCHNATTERLY, SE ^{[1
]}

TARRIO, C ^{[1
]}

机构：

[1] NATL INST STAND & TECHNOL, PHYS LAB, GAITHERSBURG, MD 20899 USA

来源：

APPLIED OPTICS | 1994年 / 33卷 / 10期

关键词：

P-TERPHENYL; PHOSPHOR; PHOTOLUMINESCENCE; SOFT X-RAY; DETECTOR; EFFICIENCY; PHOTON DAMAGE;

D O I：

10.1364/AO.33.001854

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The organic phosphor p-terphenyl is used as a wavelength-converter coating in some soft-x-ray detectors. We have measured the absolute photoluminescent efficiency of p-terphenyl as a function of incident photon energy from 36 to 191 eV. We have also measured changes in the efficiency caused by soft-x-ray fluence (total photons absorbed per unit area) at several photon energies in this range. We find that efficiency drops rapidly as a function of fluence, with the rate of decrease increasing with higher soft x-ray energies.

引用

页码：1854 / 1856

页数：3

共 21 条

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