MEASUREMENT OF PHOTOEMITTED ELECTRON ENERGY DISTRIBUTIONS BY AC METHOD

被引:105
作者
SPICER, WE
BERGLUND, CN
机构
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D O I
10.1063/1.1719251
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:1665 / &
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[1]   ELECTRON SCATTERING AND THE PHOTOEMISSION FROM CESIUM ANTIMONIDE [J].
APKER, L ;
TAFT, E ;
DICKEY, J .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1953, 43 (02) :78-80
[2]   PHOTOELECTRIC EMISSION AND CONTACT POTENTIALS OF SEMICONDUCTORS [J].
APKER, L ;
TAFT, E ;
DICKEY, J .
PHYSICAL REVIEW, 1948, 74 (10) :1462-1474
[3]  
BERGLUND CN, TO BE PUBLISHED
[4]   REFLECTANCE AND PHOTOEMISSION FROM SI [J].
BRUST, D ;
PHILLIPS, JC ;
COHEN, ML .
PHYSICAL REVIEW LETTERS, 1962, 9 (09) :389-&
[5]   METHOD OF MEASURING NORMAL VELOCITY DISTRIBUTION OF SECONDARY ELECTRONS AT LOW PRIMARY BOMBARDING ENERGIES [J].
EVTUHOV, V ;
SMITH, GF ;
YAGGY, LS .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (12) :1362-&
[6]   DIRECT AND INDIRECT EXCITATION PROCESSES IN PHOTOELECTRIC EMISSION FROM SILICON [J].
GOBELI, GW ;
ALLEN, FG .
PHYSICAL REVIEW, 1962, 127 (01) :141-&
[7]   THEORY OF PHOTOELECTRIC EMISSION FROM SEMICONDUCTORS [J].
KANE, EO .
PHYSICAL REVIEW, 1962, 127 (01) :131-&
[8]   IMPROVED ELECTRICAL DIFFERENTIATION OF RETARDING POTENTIAL MEASUREMENTS [J].
LEDER, LB ;
SIMPSON, JA .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1958, 29 (07) :571-574
[9]   PHOTOEMISSIVE STUDIES OF BAND STRUCTURE OF SILICON [J].
SPICER, WE ;
SIMON, RE .
PHYSICAL REVIEW LETTERS, 1962, 9 (09) :385-&
[10]   D BAND OF COPPER [J].
SPICER, WE ;
BERGLUND, CN .
PHYSICAL REVIEW LETTERS, 1964, 12 (01) :9-&