ENHANCEMENT OF PHOTOLUMINESCENCE QUANTUM EFFICIENCY IN SEMICONDUCTOR STRUCTURES WITH REDUCED DIMENSIONALITY

被引:10
作者
EFROS, AL
PRIGODIN, VN
机构
[1] MAX PLANCK INST FESTKORPERFORSCH,W-7000 STUTTGART 80,GERMANY
[2] AF IOFFE INST,ST PETERSBURG 194021,RUSSIA
关键词
D O I
10.1063/1.109174
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated photoluminescence quantum efficiency (QE) in disordered semiconductor systems. The value of QE is shown to depend strongly on the ratio of the temperature to the energy spread of localized electron states. We found that the high recombination rate of nonradiative centers (killers) could be reduced by the low mobility of carriers. The consequence is an enhancement of QE which is ever more remarkable in 1d semiconductor structures. This result can be used as an explanation for the high QE of porous Si, which is represented as an example of a disordered quasi-one-dimensional structure.
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页码:3013 / 3015
页数:3
相关论文
共 11 条
[1]   EXCITATION DYNAMICS IN RANDOM ONE-DIMENSIONAL SYSTEMS [J].
ALEXANDER, S ;
BERNASCONI, J ;
SCHNEIDER, WR ;
ORBACH, R .
REVIEWS OF MODERN PHYSICS, 1981, 53 (02) :175-198
[2]   PHOTOLUMINESCENCE OF HIGH POROSITY AND OF ELECTROCHEMICALLY OXIDIZED POROUS SILICON LAYERS [J].
BSIESY, A ;
VIAL, JC ;
GASPARD, F ;
HERINO, R ;
LIGEON, M ;
MULLER, F ;
ROMESTAIN, R ;
WASIELA, A ;
HALIMAOUI, A ;
BOMCHIL, G .
SURFACE SCIENCE, 1991, 254 (1-3) :195-200
[3]   SILICON QUANTUM WIRE ARRAY FABRICATION BY ELECTROCHEMICAL AND CHEMICAL DISSOLUTION OF WAFERS [J].
CANHAM, LT .
APPLIED PHYSICS LETTERS, 1990, 57 (10) :1046-1048
[4]   ELECTROLUMINESCENCE STUDIES IN SILICON DIOXIDE FILMS CONTAINING TINY SILICON ISLANDS [J].
DIMARIA, DJ ;
KIRTLEY, JR ;
PAKULIS, EJ ;
DONG, DW ;
KUAN, TS ;
PESAVENTO, FL ;
THEIS, TN ;
CUTRO, JA ;
BRORSON, SD .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (02) :401-416
[5]  
HYBERTSEN MS, 1992, 1991 P MAT RES SOC S, P179
[6]   PERCOLATION AND CONDUCTION [J].
KIRKPATRICK, S .
REVIEWS OF MODERN PHYSICS, 1973, 45 (04) :574-588
[7]   POROUS SILICON FORMATION - A QUANTUM WIRE EFFECT [J].
LEHMANN, V ;
GOSELE, U .
APPLIED PHYSICS LETTERS, 1991, 58 (08) :856-858
[8]  
PETROVAKOCH V, 1990, 20TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF SEMICONDUCTORS, VOLS 1-3, P2383
[9]  
PRIGODIN VN, 1985, SOV PHYS-SOLID STATE, V26, P2154
[10]   MECHANISMS OF VISIBLE-LIGHT EMISSION FROM ELECTROOXIDIZED POROUS SILICON [J].
VIAL, JC ;
BSIESY, A ;
GASPARD, F ;
HERINO, R ;
LIGEON, M ;
MULLER, F ;
ROMESTAIN, R ;
MACFARLANE, RM .
PHYSICAL REVIEW B, 1992, 45 (24) :14171-14176