ESTIMATION OF THE ULTIMATE FREQUENCY STABILITY OF SEMICONDUCTOR-LASERS

被引:36
作者
OHTSU, M [1 ]
FUKADA, H [1 ]
TAKO, T [1 ]
TSUCHIDA, H [1 ]
机构
[1] TOKYO INST TECHNOL,PRECIS MACH & ELECTR RES LAB,MIDORI KU,YOKOHAMA,KANAGAWA 227,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1983年 / 22卷 / 07期
关键词
D O I
10.1143/JJAP.22.1157
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1157 / 1166
页数:10
相关论文
共 33 条
[1]   TRANSVERSE MODE STABILIZED ALX GA1-XAS INJECTION-LASERS WITH CHANNELED-SUBSTRATE-PLANAR STRUCTURE [J].
AIKI, K ;
NAKAMURA, M ;
KURODA, T ;
UMEDA, J ;
ITO, R ;
CHINONE, N ;
MAEDA, M .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1978, 14 (02) :89-94
[2]   STATISTICS OF ATOMIC FREQUENCY STANDARDS [J].
ALLAN, DW .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (02) :221-&
[3]   PRESSURE SHIFT AND BROADENING OF METHANE LINE AT 3.39 MU STUDIED BY LASER-SATURATED MOLECULAR ABSORPTION [J].
BARGER, RL ;
HALL, JL .
PHYSICAL REVIEW LETTERS, 1969, 22 (01) :4-+
[4]   CHARACTERIZATION OF FREQUENCY STABILITY [J].
BARNES, JA ;
CHI, AR ;
CUTLER, LS ;
HEALEY, DJ ;
LEESON, DB ;
MCGUNIGAL, TE ;
MULLEN, JA ;
SMITH, WL ;
SYDNOR, RL ;
VESSOT, RFC ;
WINKLER, GMR .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1971, IM20 (02) :105-+
[5]  
BARNES JA, 1970, NBS394 TECHN NOT
[6]   LASER OPERATION AT 3.39-MU IN A HELIUM-NEON MIXTURE [J].
BLOOM, AL ;
BELL, WE ;
REMPEL, RC .
APPLIED OPTICS, 1963, 2 (03) :317-318
[7]   LASER ABSOLUTE WAVELENGTH STANDARD PROBLEM [J].
HALL, JL .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1968, QE 4 (10) :638-+
[8]   FREQUENCY STABILITY OF METHANE-STABILIZED HE-NE LASERS [J].
HELLWIG, H ;
BERGQUIS.JC ;
BELL, HE ;
KARTASCH.P .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (02) :450-&
[9]   THEORY OF THE LINEWIDTH OF SEMICONDUCTOR-LASERS [J].
HENRY, CH .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1982, 18 (02) :259-264
[10]   CARRIER DENSITY DEPENDENCE OF REFRACTIVE-INDEX IN ALGAAS SEMICONDUCTOR-LASERS [J].
ITO, M ;
KIMURA, T .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1980, 16 (09) :910-911