USE OF ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI) IN THE MEASUREMENT OF STATIC AND DYNAMIC SURFACE DISPLACEMENTS

被引：73

作者：

WYKES, C

机构：

来源：

OPTICAL ENGINEERING | 1982年 / 21卷 / 03期

关键词：

D O I：

10.1117/12.7972922

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：400 / 406

页数：7

共 29 条

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