APPLICATIONS OF CONVERGENT BEAM ELECTRON-DIFFRACTION IN MATERIALS SCIENCE

被引：5

作者：

EAGLESHAM, DJ ^{[1
]}

机构：

[1] UNIV LIVERPOOL,DEPT MAT SCI & ENGN,LIVERPOOL L69 3BX,ENGLAND

来源：

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1989年 / 13卷 / 01期

关键词：

D O I：

10.1002/jemt.1060130109

中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：66 / 75

页数：10

共 54 条

[1]

BAKER JR, 1982, ELECTRON MICROS, P637

[2] CRYSTALLOGRAPHY AND MICROSTRUCTURE OF Y1BA2CU3O9-X, A PEROVSKITE-BASED SUPERCONDUCTING OXIDE [J].

BEYERS, R ;

LIM, G ;

ENGLER, EM ;

SAVOY, RJ ;

SHAW, TM ;

DINGER, TR ;

GALLAGHER, WJ ;

SANDSTROM, RL .

APPLIED PHYSICS LETTERS, 1987, 50 (26) :1918-1920

[3] HIGHER-ORDER LAUE ZONE DIFFRACTION FROM ZONE AXES CONTAINING ZIGZAGGED STRINGS - THEORY AND APPLICATION TO THE COMMENSURATE SUPERLATTICE STATE OF 2H-TASE2 [J].

BIRD, DM .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1985, 18 (03) :481-498

[4] THEORY OF ZONE AXIS ELECTRON-DIFFRACTION [J].

BIRD, DM .

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1989, 13 (02) :77-97

[5]

BIRD DM, 1983, I PHYS C SER, V68, P41

[6] THE DETERMINATION OF THE COMMENSURATELY MODULATED STRUCTURE OF TANTALUM TETRATELLURIDE [J].

BRONSEMA, KD ;

VANSMAALEN, S ;

DEBOER, JL ;

WIEGERS, GA ;

JELLINEK, F ;

MAHY, J .

ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1987, 43 :305-313

[7] BLOCH WAVES AND HIGHER-ORDER LAUE ZONE EFFECTS IN HIGH-ENERGY ELECTRON-DIFFRACTION [J].

BUXTON, BF .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1976, 350 (1662) :335-&

[8] SYMMETRY OF ELECTRON-DIFFRACTION ZONE AXIS PATTERNS [J].

BUXTON, BF ;

EADES, JA ;

STEEDS, JW ;

RACKHAM, GM .

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1976, 281 (1301) :171-+

[9] APPLICATIONS OF MODERN MICRODIFFRACTION TO MATERIALS SCIENCE [J].

CARPENTER, RW ;

SPENCE, JCH .

JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV) :165-178

[10] CONVERGENT BEAM DIFFRACTION STUDIES OF INTERFACES, DEFECTS, AND MULTILAYERS [J].

CHERNS, D ;

PRESTON, AR .

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1989, 13 (02) :111-122

← 1 2 3 4 5 6 →