CROSS-SECTIONING OF LAYERED THIN-FILMS BY ULTRAMICROTOMY

被引：8

作者：

MARSHALL, AF ^{[1
]}

DOBBERTIN, DC ^{[1
]}

机构：

[1] IBM CORP,RES LAB,SAN JOSE,CA 95193

来源：

ULTRAMICROSCOPY | 1986年 / 19卷 / 01期

关键词：

D O I：

10.1016/0304-3991(86)90008-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：69 / 73

页数：5

共 11 条

[1] THE PREPARATION OF CROSS-SECTION SPECIMENS FOR TRANSMISSION ELECTRON-MICROSCOPY [J].

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[2]

CSENCSITS R, UNPUB J ELECTRON MIC

[3] TRANSMISSION ELECTRON-MICROSCOPY OF HYDROGENATED AMORPHOUS-SEMICONDUCTOR SUPERLATTICES [J].

DECKMAN, HW ;

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ABELES, B .

APPLIED PHYSICS LETTERS, 1985, 46 (02) :171-173

[4] CHARACTERIZATION OF LAYERED SYNTHETIC MICROSTRUCTURE BY TRANSMISSION ELECTRON-MICROSCOPY AND DIFFRACTION [J].

LEPETRE, Y ;

RASIGNI, G .

OPTICS LETTERS, 1984, 9 (10) :433-434

[5]

MATIJASEVIC V, 1985, UNPUB FAL MAT RES SO

[6]

NARAYAN PB, 1985, 43TH P ANN EMSA M, P212

[7] FILM STRUCTURE AND MAGNETIC-PROPERTIES FOR CO-CR SPUTTERED FILMS [J].

SAGOI, M ;

NISHIKAWA, R ;

SUZUKI, T .

IEEE TRANSACTIONS ON MAGNETICS, 1984, 20 (05) :2019-2024

[8] A NEW CROSS-SECTIONAL THINNING TECHNIQUE FOR TRANSMISSION ELECTRON-MICROSCOPY [J].

SWEENEY, J .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (03) :918-920

[9] PREPARATION OF METAL SPECIMENS FOR HREM BY ULTRAMICROTOMY [J].

TIMSIT, RS ;

HUTCHISON, JL ;

THORNTON, MC .

ULTRAMICROSCOPY, 1984, 15 (04) :371-374

[10]

VONHEIMENDAHL M, 1980, ELECTRON MICROSCOPY

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