ALGAAS/GE/GAAS HETEROJUNCTION BIPOLAR-TRANSISTORS GROWN BY MOLECULAR-BEAM EPITAXY

被引:22
作者
STRITE, S [1 ]
UNLU, MS [1 ]
ADOMI, K [1 ]
GAO, GB [1 ]
MORKOC, H [1 ]
机构
[1] UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
基金
美国国家科学基金会;
关键词
Germanium and Alloys - Molecular Beam Epitaxy - Semiconducting Gallium Arsenide;
D O I
10.1109/55.55260
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The first N-Al0.22Ga0.78As emitter, p-Ge base, and n-GaAs collector (AIGaAs/Ge/GaAs) heterojunction bipolar transistor (HBT) has been grown by molecular beam epitaxy. Devices exhibited common-emitter current gains of as high as 300 at a collector current density of 2000 A/cm2 and a collector voltage of 4 V. As the device area is reduced from 50 × 50 to 10 × 40 µm, the current gain did not show significant changes, suggesting a low surface recombination velocity in the Ge base. © 1990 IEEE
引用
收藏
页码:233 / 235
页数:3
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