ION OPTICS OF ION MICROPROBE INSTRUMENTS

被引:17
作者
LIEBL, H
机构
关键词
D O I
10.1016/0042-207X(83)90045-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:525 / 531
页数:7
相关论文
共 43 条
[1]   EMISSION CHARACTERISTICS OF A LIQUID CESIUM ION-SOURCE [J].
AITKEN, KL ;
MAIR, GLR .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1980, 13 (11) :2165-&
[2]  
Andersen CA., 1970, INT J MASS SPECTROM, V3, P413, DOI [10.1016/0020-7381(70)80001-8, DOI 10.1016/0020-7381(70)80001-8]
[3]  
BENTZ BL, 1982, SPRINGER SERIES CHEM, V19, P30
[4]   KOHLER ILLUMINATION AND BRIGHTNESS MEASUREMENT WITH LANTHANUM HEXABORIDE CATHODES [J].
BROERS, AN .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (06) :1692-1698
[5]   APPLICATION OF DYNAMIC EMITTANCE MATCHING TO SECONDARY ION MASS-SPECTROMETRY [J].
CAMPANA, JE ;
DECORPO, JJ ;
WYATT, JR .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (10) :1517-1520
[6]   MINIATURE ION SOURCES FOR ANALYTICAL INSTRUMENTS [J].
CLAMPITT, R ;
JEFFERIES, DK .
NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :739-742
[7]  
DIXON AJ, 1980, I PHYS C SER, V54, P292
[8]   H-2 AND RARE-GAS FIELD-ION SOURCE WITH HIGH ANGULAR CURRENT [J].
HANSON, GR ;
SIEGEL, BM .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (06) :1875-1878
[9]  
HIGATSBERGER MJ, 1982, SPRINGER SER CHEM PH, V19, P38
[10]   SCANNING MICROBEAM USING A LIQUID-METAL ION-SOURCE [J].
ISHITANI, T ;
TAMURA, H ;
TODOKORO, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (01) :80-83