HIGH-RESOLUTION ELECTRON-MICROSCOPY IN THE STUDY OF SEMICONDUCTING MATERIALS

被引:5
作者
HUTCHISON, JL
机构
[1] Univ of Oxford, Dep of Metallurgy, & Science of Materials, Oxford,, Engl, Univ of Oxford, Dep of Metallurgy & Science of Materials, Oxford, Engl
关键词
D O I
10.1016/0304-3991(84)90074-3
中图分类号
TH742 [显微镜];
学科分类号
摘要
SEMICONDUCTOR MATERIALS
引用
收藏
页码:51 / 59
页数:9
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