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DETERMINING SPECIFIC CONTACT RESISTIVITY FROM CONTACT END RESISTANCE MEASUREMENTS - COMMENT

被引：3
作者：
FINETTI, M
SCORZONI, A
SONCINI, G
机构：
来源：
IEEE ELECTRON DEVICE LETTERS | 1985年 / 6卷 / 04期
关键词：
D O I：
10.1109/EDL.1985.26090
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：184 / 185
页数：2
相关论文
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[5]   DIRECT MEASUREMENTS OF INTERFACIAL CONTACT RESISTANCE, END CONTACT RESISTANCE, AND INTERFACIAL CONTACT LAYER UNIFORMITY [J].
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[7]  
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