PERFORMANCE OF A QUARTER-MICROMETER-GATE BALLISTIC ELECTRON HEMT

被引：30

作者：

AWANO, Y

KOSUGI, M

MIMURA, T

ABE, M

机构：

来源：

IEEE ELECTRON DEVICE LETTERS | 1987年 / 8卷 / 10期

关键词：

D O I：

10.1109/EDL.1987.26691

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：451 / 453

页数：3

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