HEAT-FLOW TRANSIENTS IN SI/PT SYSTEMS

被引：12

作者：

DANNA, E ^{[1
]}

LEGGIERI, G ^{[1
]}

LUCHES, A ^{[1
]}

NAVA, F ^{[1
]}

机构：

[1] UNIV MODENA,IST FIS,I-41100 MODENA,ITALY

来源：

THIN SOLID FILMS | 1983年 / 110卷 / 01期

关键词：

D O I：

10.1016/0040-6090(83)90176-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：83 / 92

页数：10

共 17 条

[1]

BAERI P, 1978, LASER EFFECTS ION IM, P38

[2]

BAOSAHIB TS, 1972, 6TH P INT C XRAY OPT, P131

[3]

BIRKOFF RD, 1982, HDB PHYSIK, V34

[4]

DALLEROSE LFD, 1983, RADIAT EFF, V69, P1

[5] DETERMINATION OF KILOVOLT ELECTRON ENERGY DISSIPATION VS PENETRATION DISTANCE IN SOLID MATERIALS [J].

EVERHART, TE ;

HOFF, PH .

JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) :5837-&

[6] ENERGY DISSIPATION IN A THIN POLYMER FILM BY ELECTRON-BEAM SCATTERING [J].

HAWRYLUK, RJ ;

HAWRYLUK, AM ;

SMITH, HI .

JOURNAL OF APPLIED PHYSICS, 1974, 45 (06) :2551-2566

[7] PULSED ELECTRON-BEAM FOR SILICON ANNEALING [J].

LEGGIERI, G ;

LUCHES, A ;

NASSISI, V ;

PERRONE, A ;

PERRONE, MR ;

MAJNI, G ;

NAVA, F .

VACUUM, 1982, 32 (01) :9-10

[8] COMPOUNDS IN THE PD-SI AND PT-SI SYSTEM OBTAINED BY ELECTRON-BOMBARDMENT AND POST-THERMAL ANNEALING [J].

MAJNI, G ;

NAVA, F ;

OTTAVIANI, G ;

DANNA, E ;

LEGGIERI, G ;

LUCHES, A ;

CELOTTI, G .

JOURNAL OF APPLIED PHYSICS, 1981, 52 (06) :4055-4061

[9] ELECTRON-BEAM INDUCED REACTIONS IN METAL SI SYSTEMS [J].

MAJNI, G ;

NAVA, F ;

OTTAVIANI, G ;

LUCHES, A ;

NASSISI, V ;

CELOTTI, G .

VACUUM, 1982, 32 (01) :11-18

[10]

MERLI PG, 1980, OPTIK, V56, P205

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