X-RAY TOPOGRAPHY OF THIN SUBSURFACE LAYERS

被引：12

作者：

AFANASEV, AM ^{[1
]}

ALEKSANDROV, PA ^{[1
]}

IMAMOV, RM ^{[1
]}

PASHAEV, EM ^{[1
]}

POLOVINKINA, VI ^{[1
]}

机构：

[1] ACAD SCI USSR,INST CRYSTALLOG,MOSCOW 117333,USSR

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1985年 / 90卷 / 02期

关键词：

D O I：

10.1002/pssa.2210900202

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：419 / 423

页数：5

共 8 条

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PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 84 (01) :73-78

[2] GRAZING BRAGG-LAUE DIFFRACTION FOR STUDYING THE CRYSTAL-STRUCTURE OF THIN-FILMS [J].

AFANASIEV, AM ;

AFANASIEV, SM ;

ALEKSANDROV, PA ;

IMAMOV, RM ;

PASHAEV, EM .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 86 (01) :K1-K5

[3]

BARRETT CS, 1945, T AM I MIN MET ENG, V161, P15

[4]

Berg WF, 1934, Z KRISTALLOGR, V89, P286

[5] SCHATTEN VON VERSETZUNGSLINIEN IM RONTGEN-DIAGRAMM [J].

BORRMANN, G ;

HARTWIG, W ;

IRMLER, H .

ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1958, 13 (05) :423-+

[6]

BORRMANN J, 1941, Z PHYS, V12, P157

[7]

BORRMANN J, 1950, Z PHYS, V127, P297

[8] THE PROJECTION TOPOGRAPH - A NEW METHOD IN X-RAY DIFFRACTION MICRORADIOGRAPHY [J].

LANG, AR .

ACTA CRYSTALLOGRAPHICA, 1959, 12 (03) :249-250

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