CONSIDERATIONS FOR APPLICATION OF SI(LI) DETECTORS IN ANALYSIS OF SUB-KEV, ION-INDUCED X-RAYS

被引：28

作者：

MUSKET, RG

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1986年 / 15卷 / 1-6期

关键词：

D O I：

10.1016/0168-583X(86)90401-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：735 / 739

页数：5

共 23 条

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[9] APPLICATIONS OF SIMULTANEOUS ION BACKSCATTERING AND ION-INDUCED X-RAY-EMISSION [J].

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[10] DETERMINATIONS OF OXIDE THICKNESSES ON TRITIDED ERBIUM FILMS USING BETA-INDUCED X-RAY-FLUORESCENCE [J].

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