共 211 条
[71]
SENSITIVITY VERSUS TARGET BACKINGS FOR ELEMENTAL ANALYSIS BY ALPHA EXCITED X-RAY-EMISSION
[J].
NUCLEAR INSTRUMENTS & METHODS,
1972, 100 (03)
:397-+
[73]
FLOCCHINI RG, 1975, ADV XRAY ANALYSIS, V18, P579
[74]
PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS
[J].
NUCLEAR INSTRUMENTS & METHODS,
1974, 116 (03)
:487-499
[75]
FOLKMANN F, 1975, J PHYS E SCI INSTRUM, V8, P429, DOI 10.1088/0022-3735/8/6/001
[76]
SENSITIVITY IN TRACE-ELEMENT ANALYSIS BY P, ALPHA AND O-16 INDUCED X-RAYS
[J].
NUCLEAR INSTRUMENTS & METHODS,
1974, 119 (01)
:117-123
[77]
FREUND UH, 1975, XRAY SPECTROM, V4, P90
[80]
GIAUQUE RD, TID4500R61 LAWR BERK