POLYCRYSTALLINE-SILICON INTEGRATED PHOTOCONDUCTORS FOR PICOSECOND PULSING AND GATING

被引:12
作者
BOWMAN, DR
HAMMOND, RB
DUTTON, RW
机构
[1] STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
[2] UNIV CALIF LOS ALAMOS NATL LAB,LOS ALAMOS,NM 87545
关键词
D O I
10.1109/EDL.1985.26209
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:502 / 504
页数:3
相关论文
共 9 条
[1]   IMPULSE-RESPONSE OF PHOTOCONDUCTORS IN TRANSMISSION-LINES [J].
AUSTON, DH .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1983, 19 (04) :639-648
[2]   ON-CHIP PICOSECOND TIME-DOMAIN MEASUREMENTS FOR VLSI AND INTERCONNECT TESTING USING PHOTOCONDUCTORS [J].
EISENSTADT, WR ;
HAMMOND, RB ;
DUTTON, RW .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (02) :364-369
[3]   INTEGRATED SILICON PHOTOCONDUCTORS FOR PICOSECOND PULSING AND GATING [J].
EISENSTADT, WR ;
HAMMOND, RB ;
DUTTON, RW .
IEEE ELECTRON DEVICE LETTERS, 1984, 5 (08) :296-299
[4]   PRACTICAL COMPARISON OF OPTOELECTRONIC SAMPLING SYSTEMS AND DEVICES [J].
EVERARD, JKA ;
CARROLL, JE .
IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION, 1983, 130 (01) :5-16
[5]  
GOOSSEN KW, UNPUB IEEE T MICROWA
[6]  
HAMMOND RB, 1985, UNPUB J APPL PHYS
[7]   PICOSECOND-DOMAIN WAVEFORM MEASUREMENTS [J].
NAHMAN, NS .
PROCEEDINGS OF THE IEEE, 1978, 66 (04) :441-454
[9]   PICOSECOND PHOTOCONDUCTIVITY IN RADIATION-DAMAGED SILICON-ON-SAPPHIRE FILMS [J].
SMITH, PR ;
AUSTON, DH ;
JOHNSON, AM ;
AUGUSTYNIAK, WM .
APPLIED PHYSICS LETTERS, 1981, 38 (01) :47-50