FAULT DETECTION IN REDUNDANT CIRCUITS

被引:56
作者
FRIEDMAN, AD
机构
来源
IEEE TRANSACTIONS ON ELECTRONIC COMPUTERS | 1967年 / EC16卷 / 01期
关键词
D O I
10.1109/PGEC.1967.264621
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:99 / +
页数:1
相关论文
共 7 条
[1]   ON FINDING A NEARLY MINIMAL SET OF FAULT DETECTION TESTS FOR COMBINATIONAL LOGIC NETS [J].
ARMSTRONG, DB .
IEEE TRANSACTIONS ON ELECTRONIC COMPUTERS, 1966, EC15 (01) :66-+
[2]  
EICHELBERG EB, 1964, 5 P S SWITCH CIRC TH
[3]  
EICHELBERG EB, 1965, IBM J RES DEV, V9
[4]   TECHNIQUES FOR DIAGNOSIS OF SWITCHING CIRCUIT FAILURES [J].
GALEY, JM ;
ROTH, JP ;
NORBY, RE .
IEEE TRANSACTIONS ON COMMUNICATION AND ELECTRONICS, 1964, 83 (74) :509-&
[5]   THE DESIGN AND USE OF HAZARD-FREE SWITCHING NETWORKS [J].
HUFFMAN, DA .
JOURNAL OF THE ACM, 1957, 4 (01) :47-62
[6]  
MCCLUSKEY EJ, 1962, REDUNDANCY TECHNIQUE, P9
[7]  
POAGE JF, 1963, THESIS PRINCETON U