A HIGH-PERFORMANCE DIRECTLY INSERTABLE SELF-ALIGNED ULTRA-RADIATION-HARD AND ENHANCED ISOLATION FIELD-OXIDE TECHNOLOGY FOR GIGAHERTZ SI-CMOS VLSI

被引:1
作者
MANCHANDA, L
HILLENIUS, SJ
LYNCH, WT
CONG, HI
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D O I
10.1109/55.31667
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:17 / 19
页数:3
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