TEMPERATURE-DEPENDENCE OF SEMICONDUCTING AND STRUCTURAL-PROPERTIES OF CR-SI THIN-FILMS

被引:73
作者
NAVA, F [1 ]
TIEN, T [1 ]
TU, KN [1 ]
机构
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
关键词
D O I
10.1063/1.334389
中图分类号
O59 [应用物理学];
学科分类号
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页码:2018 / 2025
页数:8
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