HIGH-POWER DENSITY THIN-FILM RESISTORS

被引：3

作者：

FAITH, TJ ^{[1
]}

机构：

[1] RCA,ASTRO ELECTR DIV,PRINCETON,NJ 08540

来源：

IEEE TRANSACTIONS ON PARTS HYBRIDS AND PACKAGING | 1975年 / 11卷 / 04期

关键词：

D O I：

10.1109/TPHP.1975.1135076

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：273 / 281

页数：9

共 7 条

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AHERN, J ;

HEID, K .

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BLACK, JR .

[3]

DEGENHART HJ, 1963, 1963 P IEEE INT CONV, P59

FAITH, TJ ;

JENNINGS, JW .

MICROELECTRONICS AND RELIABILITY, 1975, 14 (01) :41-&

[5]

FAITH TJ, FLUID ABRASIVE TRIMM

[6] NICKEL-CHROMIUM RESISTOR FAILURE MODES AND THEIR IDENTIFICATION [J].

KEENAN, WF ;

RUNYAN, WR .

MICROELECTRONICS AND RELIABILITY, 1973, 12 (02) :125-&

[7]

PHILOFSKY E, 1970, 8TH P ANN REL PHYS S, P191