FLIGHT QUALITY NICKEL-CHROMIUM FILMS WITH SHEET RESISTANCES UP TO 420 OHMS PER SQUARE

被引：3

作者：

FAITH, TJ ^{[1
]}

JENNINGS, JW ^{[1
]}

机构：

[1] RCA,ASTRO ELECTR DIV,PRINCETON,NJ 08540

来源：

MICROELECTRONICS AND RELIABILITY | 1975年 / 14卷 / 01期

关键词：

D O I：

10.1016/0026-2714(75)90460-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：41 / &

共 9 条

[1]

AHERN J, 1972, IEEE T, VPHP8, P10

[2]

DEGENHART HJ, 1963, 1963 P IEEE INT CONV, P59

HARDY, WR ;

MURTI, DK .

[4] NICKEL-CHROMIUM RESISTOR FAILURE MODES AND THEIR IDENTIFICATION [J].

KEENAN, WF ;

RUNYAN, WR .

MICROELECTRONICS AND RELIABILITY, 1973, 12 (02) :125-&

[5]

LAKSHAMANAN TK, 1961, 8TH T NAT VAC S, P868

[6]

PHILOFSKY E, 1970, 8TH P ANN REL PHYS S, P191

[7]

Vinikman V., 1973, Microelectronics, V5, P41

[8]

WIED OJ, 1965, 3 T INT VAC C STUTT, P59

[9]

1968, MILSTD883 US DEP DEF