RECONSTRUCTION OF TRUE TOPOGRAPHIES OF SOLID-SURFACES IN SCANNING ELECTRON-MICROSCOPES USING SECONDARY ELECTRONS

被引:11
作者
KHOLODILOV, OV
GRIGORYEV, AY
MYSHKIN, NK
机构
关键词
D O I
10.1002/sca.4950090404
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:156 / 161
页数:6
相关论文
共 11 条
[2]  
DERKACH VP, 1974, ELECTRON PROBE DEVIC, P160
[3]  
EVERHART TE, 1970, 3RD ANN CAMBR STER C, P1
[4]  
GOLDSTEIN LI, 1975, PRACTICAL SCANNING E, P38
[5]  
KHOLODILOV OV, 1985, SOV J FRICTION WEAR, V4, P133
[6]  
LANE WC, 1970, 3 ANN STER S, P83
[7]   TESTING OF DETECTOR STRATEGIES IN SCANNING ELECTRON-MICROSCOPY BY ISODENSITIES [J].
LANGE, M ;
REIMER, L ;
TOLLKAMP, C .
JOURNAL OF MICROSCOPY-OXFORD, 1984, 134 (APR) :1-12
[8]  
Lebiedzik J., 1979, Scanning, V2, P230, DOI 10.1002/sca.4950020405
[9]  
OATLEY CW, 1965, ADV ELECTRONICS ELEC, P81
[10]  
RASKI JZ, 1986, THESIS U MICHIGAN AN