WIDE BAND MEASUREMENT OF THE REFRACTIVE-INDEX OF OPTICAL THIN-FILMS DURING THEIR DEPOSITION

被引：3

作者：

ARNON, O ^{[1
]}

CHOU, TJ ^{[1
]}

机构：

[1] INFICON LEYBOLD HERAEUS INC,SYRACUSE,NY 13057

来源：

THIN SOLID FILMS | 1982年 / 91卷 / 01期

关键词：

D O I：

10.1016/0040-6090(82)90120-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：23 / 31

页数：9

共 14 条

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[3]

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[4]

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[5]

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[10] REFRACTIVE-INDEX OF SOME OXIDE AND FLUORIDE COATING MATERIALS [J].

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