REFRACTIVE-INDEX OF SOME OXIDE AND FLUORIDE COATING MATERIALS

被引：73

作者：

SMITH, D ^{[1
]}

BAUMEISTER, P ^{[1
]}

机构：

[1] UNIV ROCHESTER, INST OPT, ROCHESTER, NY 14627 USA

来源：

APPLIED OPTICS | 1979年 / 18卷 / 01期

关键词：

D O I：

10.1364/AO.18.000111

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Spectroreflectometry was used to measure the refractive index of the following optical coating materials:Ta2O5, HfO2, Y2O3, La2O3, ZrO2, CeO2, CeF3, LaF3, NdF3, MgF2 in the 250–2000-nm spectral range. © 1979 Optical Society of America.

引用

页码：111 / 115

页数：5

共 24 条

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