PREPARATION AND LIFETEST OF NIOBIUM JOSEPHSON JUNCTION TUNNEL-DIODES AND ARRAYS

被引:16
作者
RISSMAN, P
PALHOLMEN, T
机构
[1] CNR, LAB CIBERNETICA, NAPLES, ITALY
[2] CNR, LAB CIBERNETICA, ARCO FELICE, ITALY
[3] CHALMERS UNIV TECHNOL, DIV ELECT ENGN, GOTHENBURG, SWEDEN
关键词
D O I
10.1016/0038-1101(74)90181-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:611 / +
页数:1
相关论文
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