Single event upset rates on 1 Mbit and 256 Kbit memories: CRUX experiment on APEX

被引：10

作者：

Adolphsen, J

Barth, JL

Stassinopoulos, EG

Gruner, T

Wennersten, M

LaBel, KA

Seidleck, CM

机构：

[1] NASA,GODDARD SPACE FLIGHT CTR,GREENBELT,MD 20771

[2] HUGHES ST SYST CORP,GREENBELT,MD 20706

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1995年 / 42卷 / 06期

关键词：

D O I：

10.1109/23.489241

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents the results from the CRUX experiment on the Air Force APEX satellite. The experiment monitors single event upsets on screened commercial 256 Kbit and 1 Mbit SRAMs. It is shown that trapped protons dominate the single event upset rates, as evidenced by correlation with measured proton flux peaks and with flux contours calculated with the AP8 model. Pitfalls of using generic ground test data are made clearly evident.

引用

页码：1964 / 1974

页数：11

共 28 条

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