ION DEFLECTION DUE TO SHEATH FIELD CURVATURE

被引:7
作者
HORWITZ, CM [1 ]
机构
[1] ELECTROGRIP,PITTSBURGH,PA 15217
关键词
D O I
10.1063/1.108807
中图分类号
O59 [应用物理学];
学科分类号
摘要
Plasma sheath electric fields, hence ion motions, deviate near patterned substrate features. This results in a basic directionality limit to ion-assisted processes. Ion deviation is here derived analytically for dc sheaths, and expressed as an ''ion isotropy ratio,'' the fraction of ions bombarding a trench sidewall instead of its bottom. This ratio is equal to (trench depth/ion acceleration distance) multiplied by a factor of about 0.5. Thus, ion deviation is especially significant for discharges with small sheath heights and yields a fundamental tradeoff between ion directionality, ion energy, and permissible ion current.
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页码:25 / 27
页数:3
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