MAGNIFICATION VARIATIONS IN REFLECTION ELECTRON-MICROSCOPY USING DIFFRACTED BEAMS

被引：14

作者：

COWLEY, JM ^{[1
]}

HOJLUNDNIELSEN, PE ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281

来源：

ULTRAMICROSCOPY | 1975年 / 1卷 / 02期

关键词：

D O I：

10.1016/S0304-3991(75)80017-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：145 / 150

页数：6

相关论文

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[2] SYSTEM FOR REFLECTION ELECTRON-MICROSCOPY AND ELECTRON-DIFFRACTION AT INTERMEDIATE ENERGIES
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