PENETRATION OF KRYPTON IONS INTO MOLYBDENUM IN GLOW DISCHARGE

[1] CLEANUP RATES OF TRACE AMOUNTS OF RADIOACTIVE KRYPTON IN VARIOUS NOBLE GAS DISCHARGES [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (01) : 230 - &

[2] DIFFUSION OF IMPURITIES INTO EVAPORATING SILICON [J]. JOURNAL OF APPLIED PHYSICS, 1959, 30 (02) : 259 - 264

[3] RANGE OF CS137 IONS OF KEV ENERGIES IN GERMANIUM [J]. CANADIAN JOURNAL OF CHEMISTRY-REVUE CANADIENNE DE CHIMIE, 1962, 40 (08): : 1605 - &

[4] NIELSEN KO, 1956, ELECTROMAGNETICALLY, P68

[5] SPUTTERING YIELDS FOR LOW ENERGY HE+-, KR+-, AND XE+-ION BOMBARDMENT [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (05) : 1842 - &

[6] SMITH ML, 1956, ELECTROMAGNETICAL ED, P68

[7] Stocker B. J., 1961, BRIT J APPL PHYS, V12, P465

[8] ION BOMBARDMENT OF SILICON IN A GLOW DISCHARGE [J]. JOURNAL OF APPLIED PHYSICS, 1963, 34 (08) : 2405 - &

[9] Wyckoff R.W.G., 1951, CRYSTAL STRUCTURES

[1] CLEANUP RATES OF TRACE AMOUNTS OF RADIOACTIVE KRYPTON IN VARIOUS NOBLE GAS DISCHARGES [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (01) : 230 - &

[2] DIFFUSION OF IMPURITIES INTO EVAPORATING SILICON [J]. JOURNAL OF APPLIED PHYSICS, 1959, 30 (02) : 259 - 264

[3] RANGE OF CS137 IONS OF KEV ENERGIES IN GERMANIUM [J]. CANADIAN JOURNAL OF CHEMISTRY-REVUE CANADIENNE DE CHIMIE, 1962, 40 (08): : 1605 - &

[4] NIELSEN KO, 1956, ELECTROMAGNETICALLY, P68

[5] SPUTTERING YIELDS FOR LOW ENERGY HE+-, KR+-, AND XE+-ION BOMBARDMENT [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (05) : 1842 - &

[6] SMITH ML, 1956, ELECTROMAGNETICAL ED, P68

[7] Stocker B. J., 1961, BRIT J APPL PHYS, V12, P465

[8] ION BOMBARDMENT OF SILICON IN A GLOW DISCHARGE [J]. JOURNAL OF APPLIED PHYSICS, 1963, 34 (08) : 2405 - &

[9] Wyckoff R.W.G., 1951, CRYSTAL STRUCTURES