ON YIELD, FAULT DISTRIBUTIONS, AND CLUSTERING OF PARTICLES

被引:90
作者
STAPPER, CH
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D O I
10.1147/rd.303.0326
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
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页码:326 / 338
页数:13
相关论文
共 16 条
[1]  
ARMSTRONG FA, UNPUB
[2]  
GANGATIRKAR P, 1982, DIGEST TECHNICAL PAP, P62
[3]  
HAM WE, 1978, RCA REV, V39, P231
[4]  
MOORE GE, 1970, ELECTRONICS, V43, P126
[5]   COST-SIZE OPTIMA OF MONOLITHIC INTEGRATED CIRCUITS [J].
MURPHY, BT .
PROCEEDINGS OF THE IEEE, 1964, 52 (12) :1537-&
[6]   MODIFICATION OF POISSON STATISTICS - MODELING DEFECTS INDUCED BY DIFFUSION [J].
PAZ, O ;
LAWSON, TR .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1977, 12 (05) :540-546
[7]  
ROGERS A, 1974, STATISTICAL ANAL SPA
[8]  
SEEDS RB, 1967, 1967 INT EL DEV M KE
[9]  
SEEDS RB, 1967, 1967 IEEE INT CONV 6, P60