MODIFICATION OF POISSON STATISTICS - MODELING DEFECTS INDUCED BY DIFFUSION

被引：51

作者：

PAZ, O ^{[1
]}

LAWSON, TR ^{[1
]}

机构：

[1] IBM CORP,DIV SYST PROD,E FISHKILL,NY 12533

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1977年 / 12卷 / 05期

关键词：

D O I：

10.1109/JSSC.1977.1050952

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：540 / 546

页数：7

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