EXPERIMENTAL EVALUATION OF BRIGHT AND DARK FIELD IMAGING MODES IN HIGH-VOLTAGE ELECTRON-MICROSCOPY

被引：2

作者：

BUTLER, EP ^{[1
]}

机构：

[1] IMPERIAL COLL SCI & TECHNOL,DEPT MET & MAT SCI,LONDON SW7 2BP,ENGLAND

来源：

关键词：

D O I：

10.1016/0047-7206(74)90005-3

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：293 / 305

页数：13

共 17 条

[1]

BELL WL, 1972, ELECTRON MICROS, P23

BUTLER, EP .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1973, 18 (01) :71-83

[3]

BUTLER EP, 1974, HIGH VOLTAGE ELECTRO, P22

COCKAYNE, DJ .

[5]

GORINGE MJ, 1974, HIGH VOLTAGE ELECTRO, P167

GRAGG, JE ;

COHEN, JB .

ACTA METALLURGICA, 1971, 19 (06) :507-&

[7]

HASHIMOTO H, 1971, JKA-JERNKONTORET ANN, V155, P479

[8]

HASHIMOTO H, 1974, HIGH VOLTAGE ELECTRO, P9

[9] MAXIMIZING PENETRATION IN HIGH VOLTAGE ELECTRON MICROSCOPY [J].

HUMPHREYS, CJ ;

THOMAS, LE ;

LALLY, JS ;

FISHER, RM .

[10]

KASTNER G, 1974, HIGH VOLTAGE ELECTRO, P172