THEORETICAL CALCULATIONS OF DEBYE LENGTH, BUILT-IN POTENTIAL AND DEPLETION LAYER WIDTH VERSUS DOPANT DENSITY IN A HEAVILY DOPED P-N-JUNCTION DIODE

被引:17
作者
TENG, KW
LI, SS
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D O I
10.1016/0038-1101(85)90007-3
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:277 / 285
页数:9
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共 11 条
[1]   THE EFFECT OF POSITION-DEPENDENT DIELECTRIC-CONSTANT ON THE ELECTRIC-FIELD AND CHARGE-DENSITY IN A P-N-JUNCTION [J].
ANDREWS, MH ;
MARSHAK, AH ;
SHRIVASTAVA, R .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (11) :6783-6787
[2]   BAND-GAP NARROWING IN HEAVILY DOPED MANY-VALLEY SEMICONDUCTORS [J].
BERGGREN, KF ;
SERNELIUS, BE .
PHYSICAL REVIEW B, 1981, 24 (04) :1971-1986
[4]   DIELECTRIC ANOMALY AND METAL-INSULATOR TRANSITION IN N-TYPE SILICON [J].
CASTNER, TG ;
LEE, NK ;
CIELOSZYK, GS ;
SALINGER, GL .
PHYSICAL REVIEW LETTERS, 1975, 34 (26) :1627-1630
[5]   TRANSITION REGION CAPACITANCE OF DIFFUSED P-N JUNCTIONS [J].
CHAWLA, BR .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1971, ED18 (03) :178-&
[7]  
Kittel C., 1980, THERMAL PHYSICS
[8]  
MULLER RS, 1977, DEVICE ELECTRONICS I
[9]   EMPIRICAL APPROXIMATIONS FOR FERMI ENERGY IN A SEMICONDUCTOR WITH PARABOLIC BANDS [J].
NILSSON, NG .
APPLIED PHYSICS LETTERS, 1978, 33 (07) :653-654
[10]   MEASUREMENT OF HEAVY DOPING PARAMETERS IN SILICON BY ELECTRON-BEAM-INDUCED CURRENT [J].
POSSIN, GE ;
ADLER, MS ;
BALIGA, BJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (05) :983-990