LONG-TERM TRANSIENT RADIATION RESPONSE OF GAAS-FETS FABRICATED ON AN AIGAAS BUFFER LAYER

被引:10
作者
ANDERSON, WT [1 ]
SIMONS, M [1 ]
TSENG, WF [1 ]
机构
[1] RES TRIANGLE INST,RES TRIANGLE PK,NC 27709
关键词
D O I
10.1109/TNS.1986.4334620
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
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页码:1442 / 1446
页数:5
相关论文
共 6 条
[1]   REDUCTION OF LONG-TERM TRANSIENT RADIATION RESPONSE IN ION-IMPLANTED GAAS-FETS [J].
ANDERSON, WT ;
SIMONS, M ;
KING, EE ;
DIETRICH, HB ;
LAMBERT, RJ .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) :1533-1538
[2]   LONG-TERM RADIATION TRANSIENTS IN GAAS-FETS [J].
SIMONS, M ;
KING, EE .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) :5080-5086
[3]   TRANSIENT RADIATION STUDY OF GAAS METAL-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS IMPLANTED IN CR-DOPED AND UNDOPED SUBSTRATES [J].
SIMONS, M ;
KING, EE ;
ANDERSON, WT ;
DAY, HM .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (11) :6630-6636
[4]  
Sze S. M., 1981, PHYS SEMICONDUCTOR D, P322
[5]  
Vodicka V. W., 1975, 1975 International Electron Devices Meeting. (Technical digest), P625, DOI 10.1109/IEDM.1975.188964
[6]  
ZULEEG R, 1982, IEEE T NUCL SCI, V29, P1656