ELECTRON-BEAM INDUCED CHARGING OF CU/MGO SURFACES

[1] INTERFACE CHEMICAL-REACTION AND DIFFUSION OF THIN METAL-FILMS ON SEMICONDUCTORS [J]. THIN SOLID FILMS, 1982, 89 (04) : 461 - 469

[2] CHANG CC, 1974, CHARACTERIZATIONS SO

[3] Fomenko V S., 1966, HDB THERMIONIC PROPE

[4] He J., UNPUB

[5] INFLUENCE OF OXYGEN ON ELECTRON-TRAPPING BY SURFACES OF METAL-OXIDES [J]. VACUUM, 1972, 22 (10) : 471 - 473

[6] DETERMINATION OF ESCAPE LENGTH OF LOW-ENERGY ELECTRONS BY AUGER AND LOSS SPECTROSCOPY [J]. THIN SOLID FILMS, 1976, 32 (02) : 362 - 362

[7] ELECTRIC DIPOLES ON CLEAN MICA SURFACES [J]. SURFACE SCIENCE, 1969, 14 (01) : 39 - &

[8] ELECTRON-BEAM DAMAGE IN AUGER-ELECTRON SPECTROSCOPY [J]. APPLIED SURFACE SCIENCE, 1981, 7 (1-2) : 115 - 141

[9] ELECTRONIC-STRUCTURE AND PROPERTIES OF MAGNESIUM-OXIDE [J]. PHYSICAL REVIEW B, 1974, 10 (12): : 5203 - 5212

[10] AUGER-ELECTRON SPECTROSCOPY IN AU PARTICLES DEPOSITED ON AIR-CLEAVED FACE (001) OF MGO CRYSTAL [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (01) : 71 - 78

[1] INTERFACE CHEMICAL-REACTION AND DIFFUSION OF THIN METAL-FILMS ON SEMICONDUCTORS [J]. THIN SOLID FILMS, 1982, 89 (04) : 461 - 469

[2] CHANG CC, 1974, CHARACTERIZATIONS SO

[3] Fomenko V S., 1966, HDB THERMIONIC PROPE

[4] He J., UNPUB

[5] INFLUENCE OF OXYGEN ON ELECTRON-TRAPPING BY SURFACES OF METAL-OXIDES [J]. VACUUM, 1972, 22 (10) : 471 - 473

[6] DETERMINATION OF ESCAPE LENGTH OF LOW-ENERGY ELECTRONS BY AUGER AND LOSS SPECTROSCOPY [J]. THIN SOLID FILMS, 1976, 32 (02) : 362 - 362

[7] ELECTRIC DIPOLES ON CLEAN MICA SURFACES [J]. SURFACE SCIENCE, 1969, 14 (01) : 39 - &

[8] ELECTRON-BEAM DAMAGE IN AUGER-ELECTRON SPECTROSCOPY [J]. APPLIED SURFACE SCIENCE, 1981, 7 (1-2) : 115 - 141

[9] ELECTRONIC-STRUCTURE AND PROPERTIES OF MAGNESIUM-OXIDE [J]. PHYSICAL REVIEW B, 1974, 10 (12): : 5203 - 5212

[10] AUGER-ELECTRON SPECTROSCOPY IN AU PARTICLES DEPOSITED ON AIR-CLEAVED FACE (001) OF MGO CRYSTAL [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (01) : 71 - 78