EMISSION SPECTROGRAPHIC ANALYSIS OF SURFACES WITH AN ION-SPUTTERING SOURCE

被引:56
作者
WAITLEVERTCH, ME [1 ]
HURWITZ, JK [1 ]
机构
[1] US STEEL CORP,RES LAB,MONROEVILLE,PA 15146
关键词
D O I
10.1366/000370276774456877
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:510 / 515
页数:6
相关论文
共 9 条
[1]   IN-DEPTH COMPOSITIONAL PROFILE ANALYSIS OF ALLOYS USING OPTICAL EMISSION GLOW-DISCHARGE SPECTROGRAPHY [J].
BELLE, CJ ;
JOHNSON, JD .
APPLIED SPECTROSCOPY, 1973, 27 (02) :118-124
[2]  
BLICKWEDE DJ, 1969, METAL PROG, P77
[3]   STUDIES OF SPUTTERING IN A GLOW-DISCHARGE FOR SPECTROCHEMICAL ANALYSIS [J].
BOUMANS, PWJ .
ANALYTICAL CHEMISTRY, 1972, 44 (07) :1219-&
[4]   GLOW-DISCHARGE OPTICAL SPECTROSCOPY AS AN ANALYTICAL DEPTH PROFILING TECHNIQUE [J].
GREENE, JE ;
SEQUEDAOSORIO, F ;
NATARAJAN, BR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01) :366-369
[5]   GLOW-DISCHARGE OPTICAL SPECTROSCOPY FOR MONITORING SPUTTER DEPOSITED FILM THICKNESS [J].
GREENE, JE ;
SEQUEDAO.F .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (06) :1144-1149
[6]   GLOW-DISCHARGE OPTICAL SPECTROSCOPY FOR ANALYSIS OF THIN-FILMS [J].
GREENE, JE ;
WHELAN, JM .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (06) :2509-2513
[7]   GLOW-DISCHARGE OPTICAL SPECTROSCOPY FOR MICROVOLUME ELEMENTAL ANALYSIS [J].
GREENE, JE ;
SEQUEDAOSORIO, F ;
NATARAJAN, BR .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (06) :2701-2709
[8]   MEASUREMENT OF BORON IMPURITY PROFILES IN SI USING GLOW-DISCHARGE OPTICAL SPECTROSCOPY [J].
GREENE, JE ;
SEQUEDAO.F ;
STREETMAN, BG ;
NOONAN, JR ;
KIRKPATRICK, CG .
APPLIED PHYSICS LETTERS, 1974, 25 (08) :435-440