共 16 条
- [2] AU-SI INTERFACE FORMATION - THE OTHER SIDE OF THE PROBLEM [J]. PHYSICAL REVIEW B, 1985, 32 (10): : 6917 - 6919
- [3] SCHOTTKY BARRIERS - AN EFFECTIVE WORK FUNCTION MODEL [J]. APPLIED PHYSICS LETTERS, 1981, 39 (09) : 727 - 729
- [6] HIGH-RESOLUTION ELECTRON-ENERGY LOSS AS A PROBE OF THE SI-AL SCHOTTKY-BARRIER FORMATION PROCESS [J]. PHYSICAL REVIEW B, 1985, 32 (04): : 2693 - 2695
- [7] DIRECT PICTURE OF THE LOCAL ELECTRONIC-STRUCTURE DURING THE SI(111)7X7-AL SCHOTTKY-BARRIER FORMATION PROCESS [J]. PHYSICAL REVIEW B, 1986, 34 (08): : 6011 - 6013
- [8] MICROSCOPIC INVESTIGATIONS OF SEMICONDUCTOR INTERFACES [J]. SOLID-STATE ELECTRONICS, 1983, 26 (06) : 499 - 513
- [9] SYNCHROTRON RADIATION PHOTOEMISSION SPECTROSCOPY OF III-VI COMPOUNDS [J]. PHYSICAL REVIEW B, 1977, 15 (08): : 3844 - 3854
- [10] MARGARITONDO G, 1984, ANNU REV MATER SCI, V14, P67