SURFACE MICROTOPOGRAPHY AND COMPOSITIONAL CHANGE OF CESIUM-ION-BOMBARDED SEMICONDUCTOR SURFACES

被引：14

作者：

HOMMA, Y

OKAMOTO, H

ISHII, Y

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1985年 / 24卷 / 08期

关键词：

D O I：

10.1143/JJAP.24.934

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：934 / 939

页数：6

共 17 条

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