MOLECULAR PARAMETERS AND LITHOGRAPHIC PERFORMANCE OF POLY(GLYCIDYL METHACRYLATE-CO-ETHYL ACRYLATE) - NEGATIVE ELECTRON RESIST

被引:57
作者
THOMPSON, LF [1 ]
BALLANTYNE, JP [1 ]
FEIT, ED [1 ]
机构
[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1975年 / 12卷 / 06期
关键词
D O I
10.1116/1.568517
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1280 / 1283
页数:4
相关论文
共 10 条
  • [1] ELECTRON-BEAM FABRICATION OF CHROMIUM MASTER MASKS
    BALLANTYNE, JP
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06): : 1257 - 1260
  • [2] CHARLESBY A, 1960, ATOMIC RADIATION POL
  • [3] ELECTRON-SCATTERING AND LINE-PROFILES IN NEGATIVE ELECTRON RESISTS
    HEIDENREICH, RD
    BALLANTYNE, JP
    THOMPSON, LF
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06): : 1284 - 1288
  • [4] FUNDAMENTAL ASPECTS OF ELECTRON-BEAM LITHOGRAPHY .1. DEPTH-DOSE RESPONSE OF POLYMERIC ELECTRON-BEAM RESISTS
    HEIDENREICH, RD
    THOMPSON, LF
    FEIT, ED
    MELLIARS.CM
    [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (09) : 4039 - 4047
  • [5] PATTERN GENERATION ON WAFERS USING ELECTRON-BEAM EXPOSURE SYSTEM (EBES)
    HENDERSON, RC
    VOSHCHENKOV, AM
    MAHONEY, GE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06): : 1261 - 1261
  • [6] HERRIOTT DR, 1975, IEEE T ELECTRON DEV, V22, P358
  • [7] APPLICATIONS OF ELECTRON-BEAM EXPOSURE SYSTEM
    PEASE, RFW
    BALLANTYNE, JP
    HENDERSON, RC
    VOSHCHENKOV, AM
    YAU, LD
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1975, ED22 (07) : 393 - 399
  • [8] THOMPSON LF, 1974, SOLID STATE TECHNOL, V17, P27
  • [9] LITHOGRAPHY AND RADIATION-CHEMISTRY OF EPOXY CONTAINING NEGATIVE ELECTRON RESISTS
    THOMPSON, LF
    FEIT, ED
    HEIDENRE.RD
    [J]. POLYMER ENGINEERING AND SCIENCE, 1974, 14 (07) : 529 - 533
  • [10] UEBERREITER K, 1968, DIFFUSION POLYM, P220