COMPARISON OF LATERAL RESOLUTION OF FINE STRIPES BERYLLIUM AND BORON IMPLANTED BY FOCUSED ION-BEAM IN SI-DOPED ALGAAS/GAAS MULTIQUANTUM WELLS

被引:1
作者
BRILLOUET, F
ISHIDA, K
MORITA, T
MIYAUCHI, E
TAKAMORI, T
NAKASHIMA, H
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1987年 / 26卷 / 08期
关键词
D O I
10.1143/JJAP.26.1320
中图分类号
O59 [应用物理学];
学科分类号
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页码:1320 / 1323
页数:4
相关论文
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