MAGNETIC AND RECORDING CHARACTERISTICS OF CO-CR-TA/CR THIN-FILM PREPARED ON SI SUBSTRATE

被引：7

作者：

KAWANABE, T ^{[1
]}

PARK, JG ^{[1
]}

NAOE, M ^{[1
]}

机构：

[1] TOKYO INST TECHNOL,DEPT PHYS ELECTR,BUNKYO KU,TOKYO 152,JAPAN

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1991年 / 27卷 / 06期

关键词：

D O I：

10.1109/20.278730

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Co85Cr15-xTa(x)(x: 0,2)/Cr films with microscopic flat surface were investigated for high density recording media. These films were deposited on silicon disk substrates at the substrate temperature T(s) of 350-degrees-C at argon pressure as low as sub-mTorr by using Facing Targets Sputtering (FTS) apparatus. The elevating of T(s) promoted the in-plane c-axis orientation of Co crystallites. The media noise due to zigzag domain were found to be reduced by using Cr underlayer as thick as 2500 angstrom at T(s) of 350-degrees-C. Media noise due to non-uniform state of magnetization in the writing process can be reduced by using smooth underlayer, suggesting that smooth film is preferable for high density recording.

引用

页码：5031 / 5033

页数：3

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