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AN OPERATIONAL METHOD TO MODEL CARRIER DEGENERACY AND BAND-GAP NARROWING
被引:10
作者
:
ADLER, MS
论文数:
0
引用数:
0
h-index:
0
ADLER, MS
机构
:
来源
:
SOLID-STATE ELECTRONICS
|
1983年
/ 26卷
/ 05期
关键词
:
D O I
:
10.1016/0038-1101(83)90094-1
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:387 / 396
页数:10
相关论文
共 15 条
[11]
POSSIN GE, 1980, TECH DIGEST IEEE IED, P270
[12]
HEAVILY DOPED TRANSPARENT-EMITTER REGIONS IN JUNCTION SOLAR-CELLS, DIODES, AND TRANSISTORS
[J].
SHIBIB, MA
论文数:
0
引用数:
0
h-index:
0
机构:
LAB AUTOMAT & ANAL SYST, TOULOUSE, FRANCE
LAB AUTOMAT & ANAL SYST, TOULOUSE, FRANCE
SHIBIB, MA
;
LINDHOLM, FA
论文数:
0
引用数:
0
h-index:
0
机构:
LAB AUTOMAT & ANAL SYST, TOULOUSE, FRANCE
LAB AUTOMAT & ANAL SYST, TOULOUSE, FRANCE
LINDHOLM, FA
;
THEREZ, F
论文数:
0
引用数:
0
h-index:
0
机构:
LAB AUTOMAT & ANAL SYST, TOULOUSE, FRANCE
LAB AUTOMAT & ANAL SYST, TOULOUSE, FRANCE
THEREZ, F
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(06)
:959
-965
[13]
MEASUREMENTS OF BANDGAP NARROWING IN SI BIPOLAR-TRANSISTORS
[J].
SLOTBOOM, JW
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
SLOTBOOM, JW
;
DEGRAAFF, HC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
DEGRAAFF, HC
.
SOLID-STATE ELECTRONICS,
1976,
19
(10)
:857
-862
[14]
SEMICONDUCTOR CURRENT-FLOW EQUATIONS (DIFFUSION AND DEGENERACY)
[J].
STRATTON, R
论文数:
0
引用数:
0
h-index:
0
STRATTON, R
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(12)
:1288
-&
[15]
TRANSPORT EQUATIONS IN HEAVY DOPED SILICON
[J].
VANOVERSTRAETEN, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
KATHOLIEKE UNIV LEUVEN, DEPT ELEKTROTECH, LAB FYS ELEKTR, LEUVEN, BELGIUM
KATHOLIEKE UNIV LEUVEN, DEPT ELEKTROTECH, LAB FYS ELEKTR, LEUVEN, BELGIUM
VANOVERSTRAETEN, RJ
;
DEMAN, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
KATHOLIEKE UNIV LEUVEN, DEPT ELEKTROTECH, LAB FYS ELEKTR, LEUVEN, BELGIUM
KATHOLIEKE UNIV LEUVEN, DEPT ELEKTROTECH, LAB FYS ELEKTR, LEUVEN, BELGIUM
DEMAN, HJ
;
MERTENS, RP
论文数:
0
引用数:
0
h-index:
0
机构:
KATHOLIEKE UNIV LEUVEN, DEPT ELEKTROTECH, LAB FYS ELEKTR, LEUVEN, BELGIUM
KATHOLIEKE UNIV LEUVEN, DEPT ELEKTROTECH, LAB FYS ELEKTR, LEUVEN, BELGIUM
MERTENS, RP
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1973,
ED20
(03)
:290
-298
←
1
2
→
共 15 条
[11]
POSSIN GE, 1980, TECH DIGEST IEEE IED, P270
[12]
HEAVILY DOPED TRANSPARENT-EMITTER REGIONS IN JUNCTION SOLAR-CELLS, DIODES, AND TRANSISTORS
[J].
SHIBIB, MA
论文数:
0
引用数:
0
h-index:
0
机构:
LAB AUTOMAT & ANAL SYST, TOULOUSE, FRANCE
LAB AUTOMAT & ANAL SYST, TOULOUSE, FRANCE
SHIBIB, MA
;
LINDHOLM, FA
论文数:
0
引用数:
0
h-index:
0
机构:
LAB AUTOMAT & ANAL SYST, TOULOUSE, FRANCE
LAB AUTOMAT & ANAL SYST, TOULOUSE, FRANCE
LINDHOLM, FA
;
THEREZ, F
论文数:
0
引用数:
0
h-index:
0
机构:
LAB AUTOMAT & ANAL SYST, TOULOUSE, FRANCE
LAB AUTOMAT & ANAL SYST, TOULOUSE, FRANCE
THEREZ, F
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(06)
:959
-965
[13]
MEASUREMENTS OF BANDGAP NARROWING IN SI BIPOLAR-TRANSISTORS
[J].
SLOTBOOM, JW
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
SLOTBOOM, JW
;
DEGRAAFF, HC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
DEGRAAFF, HC
.
SOLID-STATE ELECTRONICS,
1976,
19
(10)
:857
-862
[14]
SEMICONDUCTOR CURRENT-FLOW EQUATIONS (DIFFUSION AND DEGENERACY)
[J].
STRATTON, R
论文数:
0
引用数:
0
h-index:
0
STRATTON, R
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(12)
:1288
-&
[15]
TRANSPORT EQUATIONS IN HEAVY DOPED SILICON
[J].
VANOVERSTRAETEN, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
KATHOLIEKE UNIV LEUVEN, DEPT ELEKTROTECH, LAB FYS ELEKTR, LEUVEN, BELGIUM
KATHOLIEKE UNIV LEUVEN, DEPT ELEKTROTECH, LAB FYS ELEKTR, LEUVEN, BELGIUM
VANOVERSTRAETEN, RJ
;
DEMAN, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
KATHOLIEKE UNIV LEUVEN, DEPT ELEKTROTECH, LAB FYS ELEKTR, LEUVEN, BELGIUM
KATHOLIEKE UNIV LEUVEN, DEPT ELEKTROTECH, LAB FYS ELEKTR, LEUVEN, BELGIUM
DEMAN, HJ
;
MERTENS, RP
论文数:
0
引用数:
0
h-index:
0
机构:
KATHOLIEKE UNIV LEUVEN, DEPT ELEKTROTECH, LAB FYS ELEKTR, LEUVEN, BELGIUM
KATHOLIEKE UNIV LEUVEN, DEPT ELEKTROTECH, LAB FYS ELEKTR, LEUVEN, BELGIUM
MERTENS, RP
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1973,
ED20
(03)
:290
-298
←
1
2
→