MEASUREMENTS OF BANDGAP NARROWING IN SI BIPOLAR-TRANSISTORS

被引：600

作者：

SLOTBOOM, JW ^{[1
]}

DEGRAAFF, HC ^{[1
]}

机构：

[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

来源：

SOLID-STATE ELECTRONICS | 1976年 / 19卷 / 10期

关键词：

D O I：

10.1016/0038-1101(76)90043-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：857 / 862

页数：6

共 33 条

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