TEMPERATURE-DEPENDENCE OF PHOTOTHERMAL DIVERGENCE SIGNAL OF GAAS

被引：5

作者：

HARAGUCHI, M

OKAMOTO, H

NUNOTANI, T

FUKUI, M

机构：

[1] Department of Optical Science and Technology, The University of Tokushima, Tokushima, 770

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1995年 / 34卷 / 6A期

关键词：

PHOTOTHERMAL SPECTROSCOPY; PHOTOTHERMAL DIVERGENCE; PTD; GAAS; THERMAL CONDUCTIVITY;

D O I：

10.1143/JJAP.34.3280

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We measured the temperature dependence of the photothermal signal intensity for undoped and doped GaAs samples using the photothermal divergence method proposed by Saito et al. [Appl. Opt. 31 (1992) 2047]. The temperature dependence of signal intensity and cutoff frequency of the signal agreed with a theoretical prediction and enabled determination of the temperature dependence of the thermal conductivity of the samples.

引用

页码：3280 / 3283

页数：4

共 11 条

[1] TEMPERATURE-DEPENDENCE OF PHOTOTHERMAL DISPLACEMENT SIGNAL IN SILICON [J].

AMATO, G ;

BENEDETTO, G ;

BOARINO, L ;

SPAGNOLO, R .

JOURNAL OF MODERN OPTICS, 1992, 39 (09) :1803-1809

[2]

BLACKMORE JS, 1982, J APPL PHYS, V53, pR123

[3] THERMAL-CONDUCTIVITY OF GALLIUM-ARSENIDE AT LOW-TEMPERATURES [J].

CHAUDHURI, N ;

WADHWA, RS ;

TIKU, P ;

SREEDHAR, AK .

PHYSICAL REVIEW B, 1973, 8 (10) :4668-4670

[4]

HESS P, 1987, PHOTOACOUSTIC PHOTOT

[5] INTERBAND CRITICAL-POINTS OF GAAS AND THEIR TEMPERATURE-DEPENDENCE [J].

LAUTENSCHLAGER, P ;

GARRIGA, M ;

LOGOTHETIDIS, S ;

CARDONA, M .

PHYSICAL REVIEW B, 1987, 35 (17) :9174-9189

[6] PHOTODISPLACEMENT SPECTROSCOPY OF SOLIDS - THEORY [J].

MIRANDA, LCM .

APPLIED OPTICS, 1983, 22 (18) :2882-2886

[7] A NEW PROBE OF THE OPTICAL-PROPERTIES OF SURFACES [J].

OLMSTEAD, MA ;

AMER, NM .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (03) :751-755

[8] PHOTOTHERMAL DISPLACEMENT SPECTROSCOPY - AN OPTICAL PROBE FOR SOLIDS AND SURFACES [J].

OLMSTEAD, MA ;

AMER, NM ;

KOHN, S ;

FOURNIER, D ;

BOCCARA, AC .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1983, 32 (03) :141-154

[9] THERMAL-WAVE DETECTION AND THIN-FILM THICKNESS MEASUREMENTS WITH LASER-BEAM DEFLECTION [J].

OPSAL, J ;

ROSENCWAIG, A ;

WILLENBORG, DL .

APPLIED OPTICS, 1983, 22 (20) :3169-3176

[10] NEW TYPE OF PHOTOTHERMAL SPECTROSCOPIC TECHNIQUE [J].

SAITO, H ;

IRIKURA, M ;

HARAGUCHI, M ;

FUKUI, M .

APPLIED OPTICS, 1992, 31 (12) :2047-2054

← 1 2 →