共 22 条
[11]
CHARACTERIZATION OF MATERIALS BY SECONDARY ION MASS-SPECTROMETRY (SIMS) - NEW POSSIBILITIES OF TRACE, MICRO AND SURFACE-ANALYSIS
[J].
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE,
1983, 315 (07)
:575-590
[13]
LODDING A, 1983, MICROCHIM ACTA S, V10, P21
[14]
MARSCHNER H, 1982, BAYERISCHES LANDESAM, V35, P23
[15]
MCHUGH JA, 1980, NBS SP, V427, P129
[16]
NAUER G, 1977, BEITR ELEKTRONENMIK, V10, P333
[19]
SCHREINER M, 1983, BEITR ELEKTRONENMIKR, V16, P313